ICM'10 Call For Paper
The 22th IEEE technically co-sponsored International Conference on Microelectronics ICM'10 will be held in Cairo, Egypt. ICM' 10 is held in cooperation with American University in Cairo and the University of Waterloo.
The ICM2010 Prospective authors are invited to submit papers on all areas of devices,
circuits and systems, including but not limited to:
- INTEGRATED CIRCUITS AND SYSTEMS Embedded system design Systems on Chip (SoCs) Digital signal and data processing Applications to computer and telecommunications systems Analog circuit techniques Design for testability VLSI design Wireless Communication Applications Custom and semi-custom circuits (design concepts, architectures and high-performance and low-power circuits)
- COMPUTER-AIDED DESIGN FOR MICROELECTRONICS Test methodologies and issues Parallel embeded systems Silicone optimization Simulation (process, device, circuit, logic, timing, functional) Layout (placement, routing, floorplanning, symbolic, ERC, DRC) Testing: Formal verification
- MICROELECTRONICS TECHNOLOGY Device characterization and modeling Device physics and novel structures Materials and material characterization techniques Process technology, CMOS, BJT, BiCMOS, GaAs Reliability and failure analysis Radiation effects Packaging, surface mount technology Opto-electronics MEMs and MOEMs Devices. Authors are invited to submit a 4-page full paper according to posted guidelines. Only electronic submissions will be accepted via the web at and the www.ieee-icm.com/ and the www.uwaterloo.com/ For the publication of the accepted papers in the proceedings, it will be required that an author would register at a non-student rate registration, which may cover up to four (4) accepted papers. Authors are expected to present their papers at the Symposium.
