The IEEE International Conference on Microelectronics (ICM) 2007 is technically co-sponsored from the IEEE Electron Devices Society. ICM 2007 is held in cooperation with the French University in Egypt. The ICM has been held in numerous countries across the Middle East and Asia over the past 18 years. ICM 2007 will include oral, poster sessions and tutorials given by experts in state-of-the-art topics.

Prospective authors are invited to submit papers on all areas of devices, circuits and systems, including but not limited to:

1- Integrated Circuits and Systems

• Embedded system design
• System on Chip (SoCs)
• System in Package (SiP)
• Digital signal and data processing
• Applications to computer and telecommunications systems
• Analog circuit techniques
• Design for testability
• VLSI design
• Wireless Communication Applications
• Integrated antenna and front-end co-design
• Custom and semi-custom circuits (design concepts, architectures and high-performance and low-power circuits)

2- Computer-Aided Design for Microelectronics

• Test methodologies and issues
• Parallel embedded systems
• Silicon optimization
• Simulation (process, device, circuit, logic, timing, functional)
• Layout (placement, routing, floorplanning, symbolic, ERC, DRC)
• Testing: Formal verification

3- Micro / Nanoelectronics Technology

• Device characterization and modeling
• Device physics and novel structures
• Materials and material characterization techniques
• Process technology, CMOS, BJT, BiCMOS, GaAs
• Reliability and failure analysis
• Radiation effects
• Packaging, surface mount technology
• Optoelectronics
• MEMS Devices